S. Boorboor; S. A. H. Feghhi; H. Jafari
Volume 6, Issue 4 , January 2014, , Pages 23-28
Abstract
Shape and size of sensitive volume are the most important parameters to model electronic devices for calculation of the SEU rate from space radiations. So far different models have been proposed for estimation of the sensitive volume. In this work, results of three models including RPP, Tetrahedral and ...
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Shape and size of sensitive volume are the most important parameters to model electronic devices for calculation of the SEU rate from space radiations. So far different models have been proposed for estimation of the sensitive volume. In this work, results of three models including RPP, Tetrahedral and Nested in calculation of sensitive volume have been compared with experimental result for AT60142 SRAM. GEANT4 as a Monte Carlo code has been used to calculate energy loss and energy straggling of ions with considering metallization and oxide layers. Comparisons between Monte Carlo and experimental results shows that RPP model estimates the SEU cross section with a large deviation in whole LET range, tetrahedral has good response in low LET's but don't follow experimental result for high LET particles and nested sensitive volume produce acceptable results for whole of LET range.
